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High resolution X-ray diffractometry and topography [1ed.]0850667585, 9780850667585

Author : D.K. Bowen, Brian K. Tanner
Description:The application of electronic materials has created a demand for reliable techniques for examining these materials. This book looks at the area of x-ray diffraction and the modern techniques available for deployment in research.
Categories: Art Graphic Arts
Year :1998
Publisher : Taylor & Francis
Language : English
N° Of Pages : 278
File Info : pdf 11 Mb

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